This title appears in the Scientific Report :
2015
Please use the identifier:
http://dx.doi.org/10.1109/IMW.2015.7150281 in citations.
Critical ReRAM Stack Parameters Controlling Complimentary versus Bipolar Resistive Switching
Critical ReRAM Stack Parameters Controlling Complimentary versus Bipolar Resistive Switching
Saved in:
Personal Name(s): | Schonhals, Alexander |
---|---|
Wouters, Dirk / Marchewka, Astrid / Breuer, Thomas / Skaja, Katharina / Rana, Vikas / Menzel, Stephan / Waser, Rainer | |
Contributing Institute: |
Elektronische Materialien; PGI-7 |
Imprint: |
IEEE
2015
|
DOI: |
10.1109/IMW.2015.7150281 |
Conference: | 2015 IEEE International Memory Workshop (IMW), Monterey (CA), 2015-05-17 - 2015-05-20 |
Document Type: |
Proceedings |
Research Program: |
Controlling Collective States |
Publikationsportal JuSER |
Description not available. |