This title appears in the Scientific Report :
2002
Scaling effects in ferroelectrics and tunnel junctions with ferroelectric barrier
Scaling effects in ferroelectrics and tunnel junctions with ferroelectric barrier
Saved in:
Personal Name(s): | Rodriguez Contreras, J. |
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Schubert, J. / Poppe, T. D. / Szot, K. / Jia, C. L. / Kohlstedt, H. / Waser, R. | |
Contributing Institute: |
Elektrokeramische Materialien; IFF-EKM Institut für Halbleiterschichten und Bauelemente; ISG-1 Mikrostrukturforschung; IFF-IMF |
Published in: |
Panamerican Advanced Studies Institute (PASI) Workshop |
Imprint: |
2002
|
Conference: | Rosario, Argentinien |
Document Type: |
Poster |
Research Program: |
Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik |
Publikationsportal JuSER |
Description not available. |