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This title appears in the Scientific Report : 2008 

Correlation of structural and optoelectronic properties of thin film silicon prepared at the transition from microcrystalline to amorphous growth

Correlation of structural and optoelectronic properties of thin film silicon prepared at the transition from microcrystalline to amorphous growth
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Personal Name(s): Reynolds, St.
Carius, R. / Finger, F. / Smirnov, V.
Contributing Institute: Photovoltaik; IEF-5
Published in: E-MRS 2008 Spring Meeting
Imprint: 2008
Conference: Strasbourg, Frankreich 2008-05-26
Document Type: Conference Presentation
Research Program: Erneuerbare Energien
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