This title appears in the Scientific Report :
2008
Correlation of structural and optoelectronic properties of thin film silicon prepared at the transition from microcrystalline to amorphous growth
Correlation of structural and optoelectronic properties of thin film silicon prepared at the transition from microcrystalline to amorphous growth
Saved in:
Personal Name(s): | Reynolds, St. |
---|---|
Carius, R. / Finger, F. / Smirnov, V. | |
Contributing Institute: |
Photovoltaik; IEF-5 |
Published in: |
E-MRS 2008 Spring Meeting |
Imprint: |
2008
|
Conference: | Strasbourg, Frankreich 2008-05-26 |
Document Type: |
Conference Presentation |
Research Program: |
Erneuerbare Energien |
Publikationsportal JuSER |
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