This title appears in the Scientific Report : 2000 

Determination of trace impurities in high-purity graphite by LA-ICP-MS
Pickhardt, C.
Becker, J. S. / Heumann, K. G. / Dietze, H.-J.
Zentralabteilung für Chemische Analysen; ZCH
15th International Mass Spectrometry Conference
2000
Barcelona 2000-08-27
Poster
Entwicklung analytischer Verfahren
Description not available.