This title appears in the Scientific Report :
2000
Determination of trace impurities in high-purity graphite by LA-ICP-MS
Determination of trace impurities in high-purity graphite by LA-ICP-MS
Saved in:
Personal Name(s): | Pickhardt, C. |
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Becker, J. S. / Heumann, K. G. / Dietze, H.-J. | |
Contributing Institute: |
Zentralabteilung für Chemische Analysen; ZCH |
Published in: |
15th International Mass Spectrometry Conference |
Imprint: |
2000
|
Conference: | Barcelona 2000-08-27 |
Document Type: |
Poster |
Research Program: |
Entwicklung analytischer Verfahren |
Publikationsportal JuSER |
Description not available. |