Pickhardt, C., Becker, J. S., Heumann, K. G., & Dietze, H. (2000). Determination of trace impurities in high-purity graphite by LA-ICP-MS.
Chicago Style CitationPickhardt, C., J. S. Becker, K. G. Heumann, andfavorite H.-J Dietze. Determination of Trace Impurities in High-purity Graphite By LA-ICP-MS. 2000.
MLA CitationPickhardt, C., J. S. Becker, K. G. Heumann, andfavorite H.-J Dietze. Determination of Trace Impurities in High-purity Graphite By LA-ICP-MS. 2000.
Warning: These citations may not always be 100% accurate.