This title appears in the Scientific Report : 2015 

Scanning Quantum Dot Microscopy
Wagner, Christian (Corresponding author)
Green, Matthew F. B. / Leinen, Philipp / Deilmann, Thorsten / Krüger, Peter / Rohlfing, Michael / Temirov, Ruslan (Corresponding author) / Tautz, Frank Stefan
John von Neumann - Institut für Computing; NIC
JARA-FIT; JARA-FIT
Funktionale Nanostrukturen an Oberflächen; PGI-3
Physical review letters, 115 (2015) 2, S. 026101
College Park, Md. APS 2015
10.1103/PhysRevLett.115.026101
Journal Article
Spectra of 2D layered materials
Controlling Electron Charge-Based Phenomena
OpenAccess
OpenAccess
Please use the identifier: http://hdl.handle.net/2128/9749 in citations.
Please use the identifier: http://dx.doi.org/10.1103/PhysRevLett.115.026101 in citations.
We introduce a scanning probe technique that enables three-dimensional imaging of local electrostatic potential fields with subnanometer resolution. Registering single electron charging events of a molecular quantum dot attached to the tip of an atomic force microscope operated at 5 K, equipped with a qPlus tuning fork, we image the quadrupole field of a single molecule. To demonstrate quantitative measurements, we investigate the dipole field of a single metal adatom adsorbed on a metal surface. We show that because of its high sensitivity the technique can probe electrostatic potentials at large distances from their sources, which should allow for the imaging of samples with increased surface roughness.