This title appears in the Scientific Report :
2015
Defect concentration profiles at complex oxide interfaces
Defect concentration profiles at complex oxide interfaces
Saved in:
Personal Name(s): | Gunkel, Felix |
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Hoffmann-Eifert, Susanne / Waser, R. / Dittmann, Regina | |
Contributing Institute: |
Elektronische Materialien; PGI-7 |
Imprint: |
2015
|
Conference: | European Materials Research Society meeting, Lille (France), 2015-05-25 - 2015-05-29 |
Document Type: |
Conference Presentation |
Research Program: |
Controlling Electron Charge-Based Phenomena |
Publikationsportal JuSER |
Description not available. |