This title appears in the Scientific Report : 2015 

Electrical Probing of Key Metal Cap Layer Induced Material Processes Influencing Metal-Oxide Based ReRAM Operation
Wouters, D. J.
Schönhals, A. / Kindsmüller, A. / Kim, Wonjoo / Breuer, Thomas / Marchewka, A. / Rana, Vikas / Menzel, Stephan / Waser, R.
Elektronische Materialien; PGI-7
Materials Research Society Meeting, Boston (Germany), 2015-11-30 - 2015-12-04
Conference Presentation
Controlling Electron Charge-Based Phenomena
Description not available.