Wouters, D. J., Schönhals, A., Kindsmüller, A., Kim, W., Breuer, T., Marchewka, A., . . . Waser, R. (2015). Electrical Probing of Key Metal Cap Layer Induced Material Processes Influencing Metal-Oxide Based ReRAM Operation.
Chicago Style CitationWouters, D. J., A. Schönhals, A. Kindsmüller, Wonjoo Kim, Thomas Breuer, A. Marchewka, Vikas Rana, Stephan Menzel, andfavorite R. Waser. Electrical Probing of Key Metal Cap Layer Induced Material Processes Influencing Metal-Oxide Based ReRAM Operation. 2015.
MLA CitationWouters, D. J., et al. Electrical Probing of Key Metal Cap Layer Induced Material Processes Influencing Metal-Oxide Based ReRAM Operation. 2015.
Warning: These citations may not always be 100% accurate.