This title appears in the Scientific Report :
2015
Electrical Probing of Key Metal Cap Layer Induced Material Processes Influencing Metal-Oxide Based ReRAM Operation
Electrical Probing of Key Metal Cap Layer Induced Material Processes Influencing Metal-Oxide Based ReRAM Operation
Saved in:
Personal Name(s): | Wouters, D. J. |
---|---|
Schönhals, A. / Kindsmüller, A. / Kim, Wonjoo / Breuer, Thomas / Marchewka, A. / Rana, Vikas / Menzel, Stephan / Waser, R. | |
Contributing Institute: |
Elektronische Materialien; PGI-7 |
Imprint: |
2015
|
Conference: | Materials Research Society Meeting, Boston (Germany), 2015-11-30 - 2015-12-04 |
Document Type: |
Conference Presentation |
Research Program: |
Controlling Electron Charge-Based Phenomena |
Publikationsportal JuSER |
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