This title appears in the Scientific Report : 2015 

Thermography and electroluminescence imaging of scribing failures in Cu(In,Ga)Se 2 thin film solar modules
Misic, B.
Pieters, Bart (Corresponding author) / Schweitzer, U. / Gerber, A. / Rau, U.
Photovoltaik; IEK-5
Physica status solidi / A, 212 (2015) 12, S. 2877 - 2888
Weinheim Wiley-VCH 2015
10.1002/pssa.201532322
Journal Article
Solar cells of the next generation
Please use the identifier: http://dx.doi.org/10.1002/pssa.201532322 in citations.
Intentionally implemented scribing failures in Cu(In,Ga)Se2 modules are studied using electroluminescence (EL) and dark lock-in thermography (DLIT). While the EL images do not allow a non-ambiguous defect distinction, the DLIT images reveal characteristic defect patterns for each defect type. In order to explain the DLIT defect appearance, we model and simulate the scribing defects in a network simulation model. The simulations yield characteristic current flow patterns for each scribing defect type and thus aid in the understanding and interpretation of the measurements.