This title appears in the Scientific Report :
2015
Please use the identifier:
http://dx.doi.org/10.1002/pssa.201532322 in citations.
Thermography and electroluminescence imaging of scribing failures in Cu(In,Ga)Se 2 thin film solar modules
Thermography and electroluminescence imaging of scribing failures in Cu(In,Ga)Se 2 thin film solar modules
Intentionally implemented scribing failures in Cu(In,Ga)Se2 modules are studied using electroluminescence (EL) and dark lock-in thermography (DLIT). While the EL images do not allow a non-ambiguous defect distinction, the DLIT images reveal characteristic defect patterns for each defect type. In ord...
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Personal Name(s): | Misic, B. |
---|---|
Pieters, Bart (Corresponding author) / Schweitzer, U. / Gerber, A. / Rau, U. | |
Contributing Institute: |
Photovoltaik; IEK-5 |
Published in: | Physica status solidi / A, 212 (2015) 12, S. 2877 - 2888 |
Imprint: |
Weinheim
Wiley-VCH
2015
|
DOI: |
10.1002/pssa.201532322 |
Document Type: |
Journal Article |
Research Program: |
Solar cells of the next generation |
Publikationsportal JuSER |
Intentionally implemented scribing failures in Cu(In,Ga)Se2 modules are studied using electroluminescence (EL) and dark lock-in thermography (DLIT). While the EL images do not allow a non-ambiguous defect distinction, the DLIT images reveal characteristic defect patterns for each defect type. In order to explain the DLIT defect appearance, we model and simulate the scribing defects in a network simulation model. The simulations yield characteristic current flow patterns for each scribing defect type and thus aid in the understanding and interpretation of the measurements. |