APA Citation

Goerigk, G., & Williamson, D. L. (2003). Anomalous small-angle X-ray scattering study of hotwire deposited amorphous silicon germanium films grown at low rates.

Chicago Style Citation

Goerigk, G., andfavorite D. L. Williamson. Anomalous Small-angle X-ray Scattering Study of Hotwire Deposited Amorphous Silicon Germanium Films Grown At Low Rates. 2003.

MLA Citation

Goerigk, G., andfavorite D. L. Williamson. Anomalous Small-angle X-ray Scattering Study of Hotwire Deposited Amorphous Silicon Germanium Films Grown At Low Rates. 2003.

Warning: These citations may not always be 100% accurate.