This title appears in the Scientific Report :
2003
Anomalous small-angle X-ray scattering study of hotwire deposited amorphous silicon germanium films grown at low rates
Anomalous small-angle X-ray scattering study of hotwire deposited amorphous silicon germanium films grown at low rates
| Personal Name(s): | Goerigk, G. |
|---|---|
| Williamson, D. L. | |
| Contributing Institute: |
Streumethoden; IFF-STM |
| Published in: |
HASYLAB Users' Meeting 2003 : HASYLAB Hamburg |
| Imprint: |
2003
|
| Conference: | Hamburg 2003-01-31 |
| Document Type: |
Poster |
| Research Program: |
Kondensierte Materie |
| Publikationsportal JuSER |
| Description not available. |