APA Citation

Hrunski, D., Schroeder, B., Scheib, M., Merz, R., Bock, W., & Wagner, C. (2008). Investigation of silicon contamination of Ta filaments used for thin film silicon deposition. Amsterdam [u.a.]: Elsevier.

Chicago Style Citation

Hrunski, D., B. Schroeder, M. Scheib, R.M Merz, W. Bock, andfavorite C. Wagner. Investigation of Silicon Contamination of Ta Filaments Used for Thin Film Silicon Deposition. Amsterdam [u.a.]: Elsevier, 2008.

MLA Citation

Hrunski, D., et al. Investigation of Silicon Contamination of Ta Filaments Used for Thin Film Silicon Deposition. Amsterdam [u.a.]: Elsevier, 2008.

Warning: These citations may not always be 100% accurate.