This title appears in the Scientific Report : 2003 

X-ray scattering from freestanding polymer films with geometrically curved surfaces
Lee, D. J.
Shin, K. / Seeck, O. / Kim, H. / Seo, Y.-S. / Tolan, M. / Rafailovich, M. H. / Sokolov, J. / Sinha, S. K.
Streumethoden; IFF-STM
Physical review letters, 90 (2003) S. 185503
College Park, Md. APS 2003
185503
10.1103/PhysRevLett.90.185503
Journal Article
Kondensierte Materie
Physical Review Letters 90
J
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Please use the identifier: http://dx.doi.org/10.1103/PhysRevLett.90.185503 in citations.
Please use the identifier: http://hdl.handle.net/2128/1319 in citations.
We show that the x-ray surface scattering from a freestanding polymer film exhibits features that cannot be explained by the usual stochastic formalism for surfaces with random height fluctuations. Instead, a geometric description of the film morphology assuming two curved surfaces characterized by a radius of curvature and a lateral cutoff length successfully accounts for the phase difference between the Kiessig fringes of the nominal "specular" and "off-specular" components of the scattering. The formalism allows one to distinguish unambiguously between conformal and anticonformal curvature morphologies at long length scales.