This title appears in the Scientific Report : 2003 

Morphology and interdiffusion behavior of evaporated metal films on crystalline diindenoperylene films
Duerr, A. C.
Schreiber, F. / Kelsch, M. / Carstanjen, H. D. / Dosch, H. / Seeck, O.
Streumethoden; IFF-STM
Journal of applied physics, 93 (2003) S. 5201 - 5209
Melville, NY American Institute of Physics 2003
5201 - 5209
10.1063/1.1556180
Journal Article
Kondensierte Materie
Journal of Applied Physics 93
J
Get full text
OpenAccess
Please use the identifier: http://hdl.handle.net/2128/1320 in citations.
Please use the identifier: http://dx.doi.org/10.1063/1.1556180 in citations.
We present a transmission electron microscopy (TEM)/Rutherford backscattering spectrometry (RBS)/x-ray-diffraction (XRD) study of Au evaporated on crystalline organic thin films of diindenoperylene (DIP). Cross-sectional TEM shows that the preparation conditions of the Au film (evaporation rate and substrate temperature) strongly determine the interfacial morphology. In situ XRD during annealing reveals that the organic layer is thermally stable up to about 150 degreesC, a temperature sufficient for most electronic applications. The x-ray measurements show that the "as-grown" Au layer exhibits a large mosaicity of around 10degrees. Upon annealing above approximate to120 degreesC the Au film starts to reorder and shows sharp (111)-diffraction features. In addition, temperature dependent RBS measurements indicate that the Au/DIP interface is thermally essentially stable against diffusion of Au in the DIP layer up to approximate to100 degreesC on the time scale of hours, dependent on the Au thickness. (C) 2003 American Institute of Physics.