This title appears in the Scientific Report :
2003
Analysis by diffraction and fluorescence methods
Analysis by diffraction and fluorescence methods
Saved in:
Personal Name(s): | Seeck, O. |
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Contributing Institute: |
Streumethoden; IFF-STM |
Published in: |
Nanoelectronics and Information Technology / ed. R. Waser. - Wiley-VCH, 2003. - 3-527-40363-9 |
Imprint: |
2003
|
ISBN: |
3-527-40363-9 |
Document Type: |
Contribution to a book Contribution to a conference proceedings |
Research Program: |
Kondensierte Materie |
Publikationsportal JuSER |
Description not available. |