This title appears in the Scientific Report : 2003 

An interfacial defect layer observed at (Ba,Sr)TiO3/Pt interface
Jin, H. Z.
Zhu, J. / Erhart, P. / Jia, C. L. / Regnery, S. / Urban, K. / Waser, R.
Elektrokeramische Materialien; IFF-EKM
Mikrostrukturforschung; IFF-IMF
Thin solid films, 429 (2003) S. 282 - 285
Amsterdam [u.a.] Elsevier 2003
282 - 285
10.1016/S0040-6090(02)01330-5
Journal Article
Kondensierte Materie
Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik
Thin Solid Films 429
J
Please use the identifier: http://dx.doi.org/10.1016/S0040-6090(02)01330-5 in citations.
Barium strontium titanate (Ba,Sr)TiO3 (BST) thin-films on Pt-substrates were studied by transmission electron microscopy. The films show a columnar structure with the grains of 10-50 nm in diameter. These are oriented parallel to the [0 0 1] direction which in turn is parallel to the film growth direction. No amorphous intergrain regions occur. The high-resolution lattice fringe pictures show for the first time that over horizontally extended areas of the interface the lattice of the BST film is modified by the introduction of a defect layer. This observation is discussed in terms of a structural origin of the so-called dead-layer effect responsible for a reduction of the film permittivity with decreasing foil thickness. (C) 2003 Elsevier Science B.V. All rights reserved.