This title appears in the Scientific Report : 2002 

High-Resolution TEM Imaging of Ga(Sb,As)GaAs Quantum Dots Grown via Seed-Layer Method
Kirmse, A. S.
Häusler, I. / Schneider, R. / Neumann, W. / Lentzen, M. / Urban, K.
Mikrostrukturforschung; IFF-IMF
15th International Congress on Electron Microscopy, Durban, South Africa, 01.09.2002-06.09.2002 : Conference Proceedings
2002
Contribution to a book
Contribution to a conference proceedings
Kondensierte Materie
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