This title appears in the Scientific Report :
2002
High-Resolution TEM Imaging of Ga(Sb,As)GaAs Quantum Dots Grown via Seed-Layer Method
High-Resolution TEM Imaging of Ga(Sb,As)GaAs Quantum Dots Grown via Seed-Layer Method
Saved in:
Personal Name(s): | Kirmse, A. S. |
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Häusler, I. / Schneider, R. / Neumann, W. / Lentzen, M. / Urban, K. | |
Contributing Institute: |
Mikrostrukturforschung; IFF-IMF |
Published in: |
15th International Congress on Electron Microscopy, Durban, South Africa, 01.09.2002-06.09.2002 : Conference Proceedings |
Imprint: |
2002
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Document Type: |
Contribution to a book Contribution to a conference proceedings |
Research Program: |
Kondensierte Materie |
Publikationsportal JuSER |
Description not available. |