This title appears in the Scientific Report : 2003 

Evaluation of compositional depth profiles in mixed phase (amorphous crystalline) silicon films from real time spectroscopic ellipsometry
Ferreira, G. M.
Ferlauto, A. S. / Koval, R. J. / Pearce, J. M. / Wronski, C. R. / Collins, R. W. / Roß, Ch. / Carius, R. / Al-Jassim, M. M. / Jones, K. M.
Institut für Photovoltaik; IPV
3rd International Conference on Spectroscopic Ellipsometry (ICSE-3)
Wien 2003-07-06
Description not available.