This title appears in the Scientific Report :
2000
Interfacial properties of soft matter thin films studied by X-ray scattering
Interfacial properties of soft matter thin films studied by X-ray scattering
Saved in:
Personal Name(s): | Seeck, O. H. |
---|---|
Sinha, S. K. / Kaendler, I. D. / Shu, D. / Shin, K. / Rafailovich, M. / Sokolov, J. / Tolan, M. | |
Contributing Institute: |
Institut für Festkörperforschung; IFF |
Published in: |
Interfacial properties of the submicron scale / ed.: J. Frommer ... - ACS/Oxford Press, 2000. - 0-8412-3691-7 |
Imprint: |
2000
|
ISBN: |
0-8412-3691-7 |
Document Type: |
Contribution to a book Contribution to a conference proceedings |
Research Program: |
Methodenentwicklung für Synchrotron- und Neutronenstrahlung |
Publikationsportal JuSER |
Description not available. |