Schmitz, S., & Schroeder, H. (2002). Leakage current measurements of STO and BST thin films interpreted by the 'dead' layer model. London [u.a.]: Taylor & Francis.
Chicago Style CitationSchmitz, S., andfavorite H. Schroeder. Leakage Current Measurements of STO and BST Thin Films Interpreted By the 'dead' Layer Model. London [u.a.]: Taylor & Francis, 2002.
MLA CitationSchmitz, S., andfavorite H. Schroeder. Leakage Current Measurements of STO and BST Thin Films Interpreted By the 'dead' Layer Model. London [u.a.]: Taylor & Francis, 2002.
Warning: These citations may not always be 100% accurate.