APA Citation

Weis, H., Müggenburg, T., Friedrich, I., Grosse, P., Harlitze, L., & Wuttig, M. (1999). Advanced characterization tools for thin films in low-E-systems. Amsterdam [u.a.]: Elsevier.

Chicago Style Citation

Weis, H., T. Müggenburg, I. Friedrich, P. Grosse, L. Harlitze, andfavorite M. Wuttig. Advanced Characterization Tools for Thin Films in Low-E-systems. Amsterdam [u.a.]: Elsevier, 1999.

MLA Citation

Weis, H., et al. Advanced Characterization Tools for Thin Films in Low-E-systems. Amsterdam [u.a.]: Elsevier, 1999.

Warning: These citations may not always be 100% accurate.