This title appears in the Scientific Report : 2001 

Nondestructive measurement of surface tritium by beta-ray X-ray spectrometry (BIXS)
Matsuyama, M.
Tanabe, T. / Philipps, V. / Finken, K. H. / Watanabe, K.
Institutsbereich I; IPP-1
Institutsbereich II; IPP-2
Journal of nuclear materials, 290-293 (2001) S. 437 - 442
Amsterdam [u.a.] Elsevier Science 2001
437 - 442
10.1016/S0022-3115(00)00581-X
Journal Article
Apparative Methoden zum Teilchenkreislauf und zur Leistungsauskopplung
Wandkonditionierung und Plasma-Wand-Prozesse
Journal of Nuclear Materials 290-293
J
Please use the identifier: http://dx.doi.org/10.1016/S0022-3115(00)00581-X in citations.
Applicability of a newly developed beta -ray induced X-ray spectrometry (BIXS) has been examined to measure nondestructively tritium retained on/in the graphite samples. Examination was carried out by using the graphite plates irradiated with tritium ions and an ALT-II limiter tile exposed to D-plasmas in TEXTOR. For the former samples, a sharp intense peak and a broad weak peak appeared clearly in the spectra; the former peak was attributed to the characteristic X-rays from argon used as a working gas, and the latter peak was assigned to the bremsstrahlung X-rays from sub-surface layers of graphite. On the other hand, for the latter sample, a rather weak characteristic X-ray peak was observed along with a diminutive bremsstrahlung X-ray peak. Although the intensities of those X-rays differed from spot to spot, the tritium levels retained on the limiter tile were determined to be 58-132 Bq/cm(2). It was concluded, therefore, that valuable information on the amount and the distribution of tritium retained on/in the wall materials can be nondestructively obtained by using the BIXS. (C) 2001 Elsevier Science B.V. All rights reserved.