This title appears in the Scientific Report : 2005 

Tritium distribution in JET Mark IIA type divertor tiles analysed by BIXS
Torikai, Y.
Matsuyama, M. / Bekris, N. / Glugla, M. / Coad, P. / Naegele, W. / Erbe, A. / Noda, N. / Philipps, V. / Watanabe, K.
Institut für Plasmaphysik; IPP
Journal of nuclear materials, 337-339 (2005) S. 575 - 579
Amsterdam [u.a.] Elsevier Science 2005
575 - 579
Journal Article
Kernfusion und Plasmaforschung
Journal of Nuclear Materials 337-339
Please use the identifier: in citations.
Distribution of tritium concentrations on the Surface and in the bulk (up to I turn in depth) in a complete poloidal set of divertor tiles exposed to D-T plasma shots in JET was measured by beta-ray-induced X-ray spectrometry (BIXS). The observed X-ray spectra showed that tritium distribution was different not only from tile to tile but also highly non-uniform in each individual tile. The peaks of bulk tritium concentration obtained by BIXS are correlated with the corresponding one obtained previously by other methods. For the first time, tritium depth profiles in the plasma-facing surface of complete divertor tiles were obtained by BIXS and they can be classified by four types of a tritium depth profile. (c) 2004 Elsevier B.V. All rights reserved.