This title appears in the Scientific Report :
2001
Please use the identifier:
http://dx.doi.org/10.1016/S0022-3115(00)00172-0 in citations.
Simulation study of carbon and tungsten deposition on W/C twin test limiter in TEXTOR-94
Simulation study of carbon and tungsten deposition on W/C twin test limiter in TEXTOR-94
In order to investigate the impurity release and surface modification on a W/C twin test limiter, made of a half of W and the other half of C, exposed to the edge plasma of TEXTOR-94, simulation calculations of ion-surface interaction are conducted by a Monte Carlo code. According to the calculation...
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Personal Name(s): | Ohya, K. |
---|---|
Kawakami, R. / Tanabe, T. / Wada, M. / Ohgo, T. / Philipps, V. / Pospieszczyk, A. / Schweer, B. / Huber, A. / Rubel, M. / von Seggern, J. / Noda, N. | |
Contributing Institute: |
Institutsbereich I; IPP-1 Institutsbereich II; IPP-2 |
Published in: | Journal of nuclear materials, 283-287 (2001) S. 1182 - 1186 |
Imprint: |
Amsterdam [u.a.]
Elsevier Science
2001
|
Physical Description: |
1182 - 1186 |
DOI: |
10.1016/S0022-3115(00)00172-0 |
Document Type: |
Journal Article |
Research Program: |
Verunreinigungsquellen in Tokamaks Teilchen- und Energietransport in der Plasmarandschicht Wandkonditionierung und Plasma-Wand-Prozesse |
Series Title: |
Journal of Nuclear Materials
283-287 |
Subject (ZB): | |
Publikationsportal JuSER |
In order to investigate the impurity release and surface modification on a W/C twin test limiter, made of a half of W and the other half of C, exposed to the edge plasma of TEXTOR-94, simulation calculations of ion-surface interaction are conducted by a Monte Carlo code. According to the calculations, experimentally observed spatial distributions of WI and CII line intensities around the W side of the limiter can be explained by physical sputtering of W, reflection of bombarding C ions and physical sputtering of implanted C. The CII line emission, resulting from thermal C atoms, around the C side of the limiter is suppressed by deposition of W, and the reflection of C ions from W deposited on C causes the CII intensity to decay more slowly than that from C without the deposition. Bombardment with deuterium edge plasmas, containing impurity W, produces a thick W layer on the C side of the limiter, whereas C implanted in the W side is strongly sputtered due to impact of most constituent D ions. (C) 2000 Elsevier Science B.V. All rights reserved. |