This title appears in the Scientific Report :
2001
Characterisation of microcrystalline silicon by spectroscopic ellipsometry and photothermal deflection spectroscopy
Characterisation of microcrystalline silicon by spectroscopic ellipsometry and photothermal deflection spectroscopy
Saved in:
Personal Name(s): | Jun, J. H. |
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Stiebig, H. / Carius, R. / Wagner, H. | |
Contributing Institute: |
Institut für Photovoltaik; IPV |
Published in: |
17th European Photovoltaic Solar Energy Conference and Exhibition |
Imprint: |
2001
|
Conference: | München 2001-10-22 |
Document Type: |
Poster |
Research Program: |
Grundlagen und Technologie von Dünnschichtsolarzellen |
Publikationsportal JuSER |
Description not available. |