This title appears in the Scientific Report :
2005
Please use the identifier:
http://dx.doi.org/10.1063/1.1897067 in citations.
Please use the identifier: http://hdl.handle.net/2128/1094 in citations.
Microstructure of epitaxial BST/SRO bilayer films on SrTiO3 substrates
Microstructure of epitaxial BST/SRO bilayer films on SrTiO3 substrates
The thickness evolution of the microstructure of epitaxial Ba0.7Sr0.3TiO3 thin films grown on SrRuO3/SrTiO3 was investigated by means of transmission electron microscopy. Within the Ba0.7Sr0.3TiO3 layer, a layered structure (three sublayers) is distinguished as for the configuration of lattice strai...
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Personal Name(s): | He, J. Q. |
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Vasco, E. / Jia, C. L. / Dittmann, R. | |
Contributing Institute: |
Elektronische Materialien; IFF-IEM Mikrostrukturforschung; IFF-IMF Center of Nanoelectronic Systems for Information Technology; CNI |
Published in: | Journal of applied physics, 97 (2005) S. 104907 |
Imprint: |
Melville, NY
American Institute of Physics
2005
|
Physical Description: |
104907 |
DOI: |
10.1063/1.1897067 |
Document Type: |
Journal Article |
Research Program: |
Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik |
Series Title: |
Journal of Applied Physics
97 |
Subject (ZB): | |
Link: |
Get full text OpenAccess |
Publikationsportal JuSER |
Please use the identifier: http://hdl.handle.net/2128/1094 in citations.
The thickness evolution of the microstructure of epitaxial Ba0.7Sr0.3TiO3 thin films grown on SrRuO3/SrTiO3 was investigated by means of transmission electron microscopy. Within the Ba0.7Sr0.3TiO3 layer, a layered structure (three sublayers) is distinguished as for the configuration of lattice strain and defects. The first sublayer extends for 3 nm from the lattice-coherent Ba0.7Sr0.3TiO3/SrRUO3 interface. The second 13-nm-thick sublayer forms a semicoherent interface with the first sublayer due to the creation of a misfit dislocation network. The third sublayer extends beyond the second sublayer exhibiting a structure characterized by compact columnar features. Planar defects are formed at the boundaries between such features. The formation of a layered structure within the Ba0.7Sr0.3TiO3 films is discussed in the light of the growth modes of films on lattice-mismatched substrates. (c) 2005 American Institute of Physics. |