This title appears in the Scientific Report :
2006
Metallic Nanogaps for Rapid Screening of Electrical Properties of Nanoscale Particles
Metallic Nanogaps for Rapid Screening of Electrical Properties of Nanoscale Particles
Saved in:
Personal Name(s): | Karthäuser, S. |
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Kronholz, S. / Waser, R. | |
Contributing Institute: |
Elektronische Materialien; IFF-IEM Center of Nanoelectronic Systems for Information Technology; CNI |
Published in: |
IEEE EDS Workshops on Advanced Electron Devices |
Imprint: |
2006
|
Conference: | Duisburg, Germany 2006-06-13 |
Document Type: |
Poster |
Research Program: |
Grundlagen für zukünftige Informationstechnologien |
Publikationsportal JuSER |
Description not available. |