This title appears in the Scientific Report :
2006
Please use the identifier:
http://dx.doi.org/10.1017/S1431927606060727 in citations.
Introduction: A Special Issue on Frontiers of Electron Microscopy in Materials Science
Introduction: A Special Issue on Frontiers of Electron Microscopy in Materials Science
Saved in:
Personal Name(s): | Urban, K. |
---|---|
Mayer, J. / Luysberg, M. / Tillmann, K. | |
Contributing Institute: |
Mikrostrukturforschung; IFF-IMF |
Published in: | Microscopy and microanalysis, 12 (2006) S. 441 |
Imprint: |
New York, NY
Cambridge University Press
2006
|
Physical Description: |
441 |
DOI: |
10.1017/S1431927606060727 |
Document Type: |
Journal Article |
Research Program: |
Kondensierte Materie |
Series Title: |
Microscopy and Microanalysis
12 |
Subject (ZB): | |
Publikationsportal JuSER |
Description not available. |