This title appears in the Scientific Report :
2006
Electrical characterization of perovskite nanostructures by SPM
Electrical characterization of perovskite nanostructures by SPM
Saved in:
Personal Name(s): | Szot, K. |
---|---|
Tiedke, S. / Reichenberg, B. / Peter, F. / Waser, R. | |
Contributing Institute: |
Elektronische Materialien; IFF-IEM Center of Nanoelectronic Systems for Information Technology; CNI |
Published in: |
Scanning Probe Microscopy : Electrical and Electromechanical Phenomena at the Nanoscale / ed.: S. V. Kalinin, A. Gruverman. - New York, Springer, 2006. - 978-0-387-28667-9. - Chapter III 9 |
Imprint: |
2006
|
ISBN: |
9780387286679 |
Document Type: |
Contribution to a book Contribution to a conference proceedings |
Research Program: |
Grundlagen für zukünftige Informationstechnologien |
Publikationsportal JuSER |
Description not available. |