This title appears in the Scientific Report :
2009
Please use the identifier:
http://dx.doi.org/10.1098/rsta.2009.0134 in citations.
Negative spherical abberation ultrahigh-resolution imaging in corrected transmission electron microscopy
Negative spherical abberation ultrahigh-resolution imaging in corrected transmission electron microscopy
Aberration-corrected transmission electron microscopy allows us to image the structure of matter at genuine atomic resolution. A prominent role for the imaging of crystalline samples is played by the negative spherical aberration imaging (NCSI) technique. The physical background of this technique is...
Saved in:
Personal Name(s): | Urban, K. |
---|---|
Jia, C.-L. / Houben, L. / Lentzen, M. / Mi, S. / Tilmann, K. | |
Contributing Institute: |
Mikrostrukturforschung; IFF-8 |
Published in: | Philosophical transactions of the Royal Society of London / A, 367 (2009) S. 3735 - 3753 |
Imprint: |
London
Soc.
2009
|
Physical Description: |
3735 - 3753 |
PubMed ID: |
19687063 |
DOI: |
10.1098/rsta.2009.0134 |
Document Type: |
Journal Article |
Research Program: |
Grundlagen für zukünftige Informationstechnologien |
Series Title: |
Philosophical Transactions of the Royal Society of London Series A
367 |
Subject (ZB): | |
Publikationsportal JuSER |
Aberration-corrected transmission electron microscopy allows us to image the structure of matter at genuine atomic resolution. A prominent role for the imaging of crystalline samples is played by the negative spherical aberration imaging (NCSI) technique. The physical background of this technique is reviewed. The especially high contrast observed under these conditions owes its origin to an enhancing combination of amplitude contrast due to electron diffraction channelling and phase contrast. A number of examples of the application of NCSI are reviewed in order to illustrate the applicability and the state-of-the-art of this technique. |