Schroeder, H. (2008). Leakage current in high-k materials for DRAM application - thickness dependence revisited.
Chicago Style CitationSchroeder, H. Leakage Current in High-k Materials for DRAM Application - Thickness Dependence Revisited. 2008.
MLA CitationSchroeder, H. Leakage Current in High-k Materials for DRAM Application - Thickness Dependence Revisited. 2008.
Warning: These citations may not always be 100% accurate.