This title appears in the Scientific Report :
2008
Please use the identifier:
http://dx.doi.org/10.1002/pssr.200802054 in citations.
Controlled local filament growth and dissolution in Ag-Ge-Se
Controlled local filament growth and dissolution in Ag-Ge-Se
Memory cells based on the cation migration and filament formation and rupture in a solid electrolyte have attracted much interest due to low switching voltages and a prospective high scalability. In this study we indirectly visualized the growth and dissolution of the conductive filament in Ag-Ge-Se...
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Personal Name(s): | Schindler, C. |
---|---|
Szot, K. / Karthäuser, S. / Waser, R. | |
Contributing Institute: |
Elektronische Materialien; IFF-6 JARA-FIT; JARA-FIT |
Published in: | Physica status solidi / Rapid research letters, 2 (2008) S. 129 - 131 |
Imprint: |
Weinheim
Wiley-VCH
2008
|
Physical Description: |
129 - 131 |
DOI: |
10.1002/pssr.200802054 |
Document Type: |
Journal Article |
Research Program: |
Grundlagen für zukünftige Informationstechnologien |
Series Title: |
Physica Status Solidi - Rapid Research Letters
2 |
Subject (ZB): | |
Publikationsportal JuSER |
Memory cells based on the cation migration and filament formation and rupture in a solid electrolyte have attracted much interest due to low switching voltages and a prospective high scalability. In this study we indirectly visualized the growth and dissolution of the conductive filament in Ag-Ge-Se samples with Ag bottom electrodes by surface analysis with Conductive Atomic Force Microscopy (CAFM). By application of a negative voltage to the inert CAFM tip, conductive filaments were grown on the scanned area and they were dissolved under reversed bias. The local conductivity changes directly corresponded to changes in the topography, i.e. to the filament protrusion and dissolution. Topography changes could be circumvented by limiting the maximum current. By placing the CAFM tip on a random spot on the sample, filaments with a diameter as low as 20 nm were grown by local current-voltage measurements. (C) 2008 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. |