Description: Structural and chemical characterization of TiO2 memristive devices by spatially-resolved NEXAFS

This title appears in the Scientific Report : 2009

Structural and chemical characterization of TiO2 memristive devices by spatially-resolved NEXAFS

We used spatially-resolved NEXAFS (near-edge x-ray absorption fine structure) spectroscopy coupled with microscopy to characterize the electronic, structural and chemical properties of bipolar resistive switching devices. Metal/TiO2/metal devices were electroformed with both bias polarities and then...

Personal Name(s):	Strachan, J.P.
	Yang, J.J. / Münstermann, R. / Scholl, A. / Medeiros-Ribeiro, G. / Stewart, D.R. / Williams, R.S.
Contributing Institute:	Elektronische Materialien; IFF-6 JARA-FIT; JARA-FIT
Published in:	Nanotechnology, 20 (2009) S. 485701
Imprint:	Bristol IOP Publ. 2009
Physical Description:	485701
DOI:	10.1088/0957-4484/20/48/485701
PubMed ID:	19880979
Document Type:	Journal Article
Research Program:	Grundlagen für zukünftige Informationstechnologien
Series Title:	Nanotechnology 20
Subject (ZB):	J
	Publikationsportal JuSER

Please use the identifier: http://dx.doi.org/10.1088/0957-4484/20/48/485701 in citations.

We used spatially-resolved NEXAFS (near-edge x-ray absorption fine structure) spectroscopy coupled with microscopy to characterize the electronic, structural and chemical properties of bipolar resistive switching devices. Metal/TiO2/metal devices were electroformed with both bias polarities and then physically opened to study the resulting material changes within the device. Soft x-ray absorption techniques allowed isolated study of the different materials present in the device with 100 nm spatial resolution. The resulting morphology and structural changes reveal a picture of localized polarity-independent heating occurring within these devices initiated by and subsequently accelerating polarity-dependent electrochemical reduction/oxidation processes.