This title appears in the Scientific Report :
2008
Please use the identifier:
http://hdl.handle.net/2128/17409 in citations.
Please use the identifier: http://dx.doi.org/10.1063/1.2901160 in citations.
Optical band gap of BiFe03 grown by adsorption-controlled molecular-beam epitaxy
Optical band gap of BiFe03 grown by adsorption-controlled molecular-beam epitaxy
BiFeO3 thin films have been deposited on (001) SrTiO3 substrates by adsorption-controlled reactive molecular-beam epitaxy. For a given bismuth overpressure and oxygen activity, single-phase BiFeO3 films can be grown over a range of deposition temperatures in accordance with thermodynamic calculation...
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Personal Name(s): | Ihlefeld, J.F. |
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Podraza, N. J. / Liu, Z.K. / Rai, R.C. / Xu, X. / Heeg, T. / Chen, Y.B. / Li, J. / Collins, R. W. / Musfeldt, J.L. / Pan, X. Q. / Schubert, J. / Ramesh, R. / Schlom, D. G. | |
Contributing Institute: |
Center of Nanoelectronic Systems for Information Technology; CNI Halbleiter-Nanoelektronik; IBN-1 |
Published in: | Applied physics letters, 92 (2008) S. 142908 |
Imprint: |
Melville, NY
American Institute of Physics
2008
|
Physical Description: |
142908 |
DOI: |
10.1063/1.2901160 |
Document Type: |
Journal Article |
Research Program: |
Grundlagen für zukünftige Informationstechnologien |
Series Title: |
Applied Physics Letters
92 |
Subject (ZB): | |
Link: |
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Publikationsportal JuSER |
Please use the identifier: http://dx.doi.org/10.1063/1.2901160 in citations.
BiFeO3 thin films have been deposited on (001) SrTiO3 substrates by adsorption-controlled reactive molecular-beam epitaxy. For a given bismuth overpressure and oxygen activity, single-phase BiFeO3 films can be grown over a range of deposition temperatures in accordance with thermodynamic calculations. Four-circle x-ray diffraction reveals phase-pure, epitaxial films with omega rocking curve full width at half maximum values as narrow as 29 arc sec (0.008 degrees). Multiple-angle spectroscopic ellipsometry reveals a direct optical band gap at 2.74 eV for stoichiometric as well as 5% bismuth-deficient single-phase BiFeO3 films. (C) 2008 American Institute of Physics. |