This title appears in the Scientific Report :
2016
Please use the identifier:
http://dx.doi.org/10.7567/JJAP.55.08NA04 in citations.
Scanning quantum dot microscopy: A quantitative method to measure local electrostatic potential near surfaces
Scanning quantum dot microscopy: A quantitative method to measure local electrostatic potential near surfaces
In this paper we review a recently introduced microscopy technique, scanning quantum dot microscopy (SQDM), which delivers quantitative maps of local electrostatic potential near surfaces in three dimensions. The key to achieving SQDM imaging is the functionalization of a scanning probe microscope t...
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Personal Name(s): | Green, Matthew F. B. |
---|---|
Wagner, Christian / Leinen, Philipp / Deilmann, Thorsten / Krüger, Peter / Rohlfing, Michael / Tautz, Frank Stefan / Temirov, Ruslan | |
Contributing Institute: |
JARA-FIT; JARA-FIT Quantum Nanoscience; PGI-3 |
Published in: | Japanese journal of applied physics, 55 (2016) 8S1, S. 08NA04 -7 |
Imprint: |
Bristol
IOP Publ.
2016
|
DOI: |
10.7567/JJAP.55.08NA04 |
Document Type: |
Journal Article |
Research Program: |
Controlling Electron Charge-Based Phenomena |
Publikationsportal JuSER |
In this paper we review a recently introduced microscopy technique, scanning quantum dot microscopy (SQDM), which delivers quantitative maps of local electrostatic potential near surfaces in three dimensions. The key to achieving SQDM imaging is the functionalization of a scanning probe microscope tip with a π-conjugated molecule that acts as a gateable QD. Mapping of electrostatic potential with SQDM is performed by gating the QD by the bias voltage applied to the scanning probe microscope junction and registering changes of the QD charge state with frequency-modulated atomic force microscopy. |