Ebert, P. (2016). Cross-sectional scanning Tunneling microscopy of GaN and InN epitaxial layers: Defects, surface states and Fermi-Level pinning.
Chicago Style CitationEbert, Philipp. Cross-sectional Scanning Tunneling Microscopy of GaN and InN Epitaxial Layers: Defects, Surface States and Fermi-Level Pinning. 2016.
MLA CitationEbert, Philipp. Cross-sectional Scanning Tunneling Microscopy of GaN and InN Epitaxial Layers: Defects, Surface States and Fermi-Level Pinning. 2016.
Warning: These citations may not always be 100% accurate.