Entwicklung und Anwendung massenspektrometrischer Methoden zur Spuren-, Ultraspuren-, Isotopen- und Oberflächenanalytik für Forschungsaufgaben des Forschungszentrums Jülich Teil 2
Entwicklung und Anwendung massenspektrometrischer Methoden zur Spuren-, Ultraspuren-, Isotopen- und Oberflächenanalytik für Forschungsaufgaben des Forschungszentrums Jülich Teil 2
Inorganic mass spectrometric methods are widely used for the multielemental determination at the trace and ultratrace level, for the isotope ratio measurements and surface analysis (depth profiling, imaging) in quite different materials (e.g., conducting, semiconducting and nonconducting solid samp...
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Personal Name(s): | Becker, J. S. (Editor) |
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Contributing Institute: |
Publikationen vor 2000; PRE-2000; Retrocat |
Imprint: |
Jülich
Forschungszentrum Jülich GmbH Zentralbibliothek, Verlag
2000
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Physical Description: |
297 p. |
Document Type: |
Report |
Research Program: |
ohne Topic |
Series Title: |
Berichte des Forschungszentrums Jülich
3821 |
Link: |
OpenAccess |
Publikationsportal JuSER |
Inorganic mass spectrometric methods are widely used for the multielemental determination at the trace and ultratrace level, for the isotope ratio measurements and surface analysis (depth profiling, imaging) in quite different materials (e.g., conducting, semiconducting and nonconducting solid samples, technical, environmental, biological, geological and water samples). The capability of inductively coupled plasma mass spectrometry (ICP-MS), laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS), secondary ion mass spectrometry (SIMS) and sputtered neutral mass spectrometry (SLAMS) have been applied as the most important mass spectrometric techniques with their multielemental capability for the characterization of solid materials (including layers and layered systems) and aqueous samples. The detection limits for the direct analysis of solid samples by inorganic solid mass spectrometry were determined up to the sub-ng g$^{-1}$ and for aqueous solution by ICP-MS up to sub-pg L$^{-1}$. The papers of the second part of the Report ofResearch Centre Juelich "Development and application ofmass spectrometric techniques for trace, ultratrace, isotope and surface analysis for research tasks ofthe Research Centre Juelich " discuss the important inorganic mass spectrometric techniques and their application for quantitative determination of trace elements, isotope ratio measurements and in surface analysis. |