This title appears in the Scientific Report : 2018 

Absolute Scale Quantitative Off-Axis Electron Holography at Atomic Resolution
Winkler, Florian (Corresponding author)
Barthel, Juri / Tavabi, Amir H. / Borghardt, Sven / Kardynal, Beata / Dunin-Borkowski, Rafal
JARA - HPC; JARA-HPC
Physik Nanoskaliger Systeme; ER-C-1
Materialwissenschaft u. Werkstofftechnik; ER-C-2
Physical review letters, 120 (2018) 15, S. 15 - 13
College Park, Md. APS 2018
10.1103/PhysRevLett.120.156101
Journal Article
Novel materials for nanoelectronics and spintronics: first principle investigation.
First principle calculations of transition metal dichalcogenides for spin-optoelectronics
Controlling Configuration-Based Phenomena
OpenAccess
OpenAccess
Please use the identifier: http://hdl.handle.net/2128/18543 in citations.
Please use the identifier: http://dx.doi.org/10.1103/PhysRevLett.120.156101 in citations.
An absolute scale match between experiment and simulation in atomic-resolution off-axis electron holography is demonstrated, with unknown experimental parameters determined directly from the recorded electron wave function using an automated numerical algorithm. We show that the local thickness and tilt of a pristine thin WSe2 flake can be measured uniquely, whereas some electron optical aberrations cannot be determined unambiguously for a periodic object. The ability to determine local specimen and imaging parameters directly from electron wave functions is of great importance for quantitative studies of electrostatic potentials in nanoscale materials, in particular when performing in situ experiments and considering that aberrations change over time.