This title appears in the Scientific Report :
2019
Development of a dual band X-mode reflectometer for the density profile measurement at the ICRF antenna in W7-X
Development of a dual band X-mode reflectometer for the density profile measurement at the ICRF antenna in W7-X
Saved in:
Personal Name(s): | Han, X. (Corresponding author) |
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Krämer-Flecken, A. / Ongena, J. / Neubauer, O. / Schweer, B. / Liang, Yunfeng / Hartmann, D. / Kallmeyer, P. / Kazakov, Y. O. | |
Contributing Institute: |
Plasmaphysik; IEK-4 |
Imprint: |
2019
|
Conference: | 14th International Reflectometry Workshop, Lausanne Swiss (Switzerland), 2019-05-22 - 2019-05-24 |
Document Type: |
Conference Presentation |
Research Program: |
Plasma-Wall-Interaction |
Publikationsportal JuSER |
Description not available. |