This title appears in the Scientific Report :
2020
Please use the identifier:
http://dx.doi.org/10.1021/acsaem.9b00061 in citations.
Dislocation Evolution and Migration at Grain Boundaries in Thermoelectric SnTe
Dislocation Evolution and Migration at Grain Boundaries in Thermoelectric SnTe
Saved in:
Personal Name(s): | Wu, Di |
---|---|
Chen, Xiang / Zheng, Fengshan / Du, Hongchu / Jin, Lei (Corresponding author) / Dunin-Borkowski, Rafal E. | |
Contributing Institute: |
Physik Nanoskaliger Systeme; ER-C-1 |
Published in: | ACS applied energy materials, 2 (2019) 4, S. 2392 - 2397 |
Imprint: |
Washington, DC
ACS Publications
2019
|
DOI: |
10.1021/acsaem.9b00061 |
Document Type: |
Journal Article |
Research Program: |
Grundlagen der Ionentransportprozesse in resistiv schaltenden Oxiden (B03) Controlling Configuration-Based Phenomena |
Publikationsportal JuSER |
Description not available. |