This title appears in the Scientific Report :
2013
Please use the identifier:
http://dx.doi.org/10.1117/12.2020276 in citations.
Reconstruction of SNOM near-field images from rigorous optical simulations by including topography artifacts
Reconstruction of SNOM near-field images from rigorous optical simulations by including topography artifacts
Saved in:
Personal Name(s): | Ermes, Markus (Corresponding author) |
---|---|
Lehnen, S. / Bittkau, K. / Carius, R. | |
Contributing Institute: |
Photovoltaik; IEK-5 |
Imprint: |
Bellingham, Wash.
SPIE
2013
|
Physical Description: |
87890I |
DOI: |
10.1117/12.2020276 |
Conference: | SPIE Optical Metrology 2013, Munich, Germany (Germany), 2013-05-13 - 2013-05-16 |
Document Type: |
Contribution to a conference proceedings Contribution to a book |
Research Program: |
Thin Film Photovoltaics |
Series Title: |
Proceedings of SPIE
8789 |
Publikationsportal JuSER |
Description not available. |