This title appears in the Scientific Report :
2015
Please use the identifier:
http://dx.doi.org/10.1117/12.2184581 in citations.
Simulation of light in-coupling through an aperture probe to investigate light propagation in a thin layer for opto-electronic application
Simulation of light in-coupling through an aperture probe to investigate light propagation in a thin layer for opto-electronic application
Saved in:
Personal Name(s): | Ermes, Markus (Corresponding author) |
---|---|
Lehnen, Stephan / Cao, Zhao / Bittkau, Karsten / Carius, Reinhard | |
Contributing Institute: |
Photovoltaik; IEK-5 |
Imprint: |
Bellingham, Wash.
SPIE
2015
|
Physical Description: |
95260W |
DOI: |
10.1117/12.2184581 |
Conference: | SPIE Optical Metrology, Munich (Germany), 2015-06-21 - 2015-06-25 |
Document Type: |
Contribution to a conference proceedings Contribution to a book |
Research Program: |
Helmholtz Interdisciplinary Doctoral Training in Energy and Climate Research (HITEC) Solar cells of the next generation |
Series Title: |
Proceedings of SPIE
9526 |
Publikationsportal JuSER |
Description not available. |