Subject
electromigration
19
metallization
6
reliability
6
microelectronics
5
mechanical stress
3
VLSI technology
2
electronic packaging
2
failure
2
thin film physics
2
HPLC (high pressure liquid chromatography)
1
adhesion
1
aluminum
1
copper
1
crystal growth
1
degradation
1
desorption
1
diffusion
1
dislocation
1
electronic structure
1
electrophoresis
1
gel electrophoresis
1
integrated circuit
1
interfacial reaction
1
liquid chromatography
1
magnetic film
1
microstructure
1
modeling
1
numerical calculation
1
packaging
1
passivation
1
phase transition
1
phonon spectrum
1
photoemission
1
scanning electron microscopy
1
semiconductor
1
semiconductor device
1
silicon
1
simulation
1
solid surface physics
1
superconducting film
1
surface
1
surface physics
1
surface reaction
1
surface structure
1
temperature dependence
1
tensile properties
1
thin film
1
transmission electron microscopy
1