Classification
FHEG - Tunneling microscopy, force microscopy
FHAB - Surface and thin film characterization
9
FFJ - Surface structure, gas solid interface
5
FFJB - Surface dynamics
5
FNX - Carbon, carbon materials
4
FHA - Materials characterization - general aspects
3
FHE - Imaging methods in materials characterization
3
FHJ - Scanning electron microscopy, analytical electron microscopy
3
FJHE - Defects and radiation effects in semiconductors
3
FJKC - III - V semiconductors
3
FFJE - Molecular surface processes, gas surface interaction, adsorption
2
FGKC - Vacuum deposition, MBE
2
CLJE - Catalyst characterization and surface phenomena
1
CLP - Colloid chemistry, surface chemistry
1
CNOP - Transport phenomena in electrolytes
1
CUSE - Raman spectroscopy
1
FCD - Crystal physics
1
FDCH - Defects in metals
1
FEJH - Low dimensional materials, intercalation compounds
1
FFA - Surface science, surface physics - general aspects
1
FFGC - Electron spectroscopy
1
FFGH - Electron emission, field emission
1
FGGJ - Ion beam analysis, ion beam solid interaction
1
FGM - Microelectronic technology
1
FGML - Characterization of electronic materials
1
FGN - Nanotechnology
1
FHEM - Image analysis in microscopy, stereology
1
FHGE - Electron diffraction
1
FJH - Semiconductor physics
1
FJKB - Elemental semiconductors
1
FLE - Superconductor materials
1
TGNE - Control engineering - applications
1