Skip to content
Toggle navigation
VuFind
0
Items in e-Shelf
(Full)
History
User Account
Logout
User Account
Help
English
Deutsch
Books & more
Articles & more
JuSER
All Fields
Title
Journal Title
Name
Institution
Subject
Classification
Shelf Classification
Table of Contents
DOI
ISBN/ISSN
Call number
Report Number
Barcode
Full Texts (available in selection)
Find
Advanced
Reset Filters
Baumgarten, Lutz
AND
Brückel, Thomas
FHE - Imaging methods in materials characterization
Reset Filters
Show filters (3)
Baumgarten, Lutz
AND
Brückel, Thomas
FHE - Imaging methods in materials characterization
Ask a Librarian
Books & more
: Hits
1 - 2
of
2
sort by
Relevance
Year (descending)
Year (ascending)
Call Number
Author
Title
Select all titles on this page
Email
Export
Print
Save
Add to e-Shelf
Select result number 1
1
E-Book
Probing the nanoworld : microscopies, scattering and spectroscopies of the solid state : lecture manuscripts of the 38th spring school of the Institute of Solid State Research on M...
Urban, Knut
2007
Other Personal Name(s):
“
...
Schweika
,
Werner
...
”
Full text
Favorites
Saved in:
QR Code
Select result number 2
2
Book
Probing the nanoworld : microscopies, scattering and spectroscopies of the solid state : lecture manuscripts of the 38th spring school of the Institute of Solid State Research on M...
Urban, Knut
2007
Other Personal Name(s):
“
...
Schweika
,
Werner
...
”
Call number:
Loading...
Located:
Loading...
Table of Contents
Literature Request
Loan/Reservation
Favorites
Saved in:
QR Code
Select all titles on this page
Email
Export
Print
Save
Add to e-Shelf
/* Narrow Search Options */ ?>
Back
Narrow Search Results
Available as
Electronic Edition
1
Print Edition
1
Material Type
Book
2
Type of Literature
Conference Publication
2
Year of Publication
From:
To:
Location
ZB
2
IBN-3-4
1
Name
Baumgarten, Lutz
Blügel, Stefan
2
Brückel, Thomas
Lentzen, Markus
2
Schneider, Claus M.
2
Schweika, Werner
2
more ...
Tillmann, Karsten
2
Urban, Knut
2
see all ...
less ...
Subject
microscopy
2
scattering
2
solid state spectroscopy
2
Classification
FHE - Imaging methods in materials characterization
Language
English
2
/* End Narrow Search Options */ ?>
×
Loading...