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CUSE - Raman spectroscopy
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FHAB - Surface and thin film characterization
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CUSE - Raman spectroscopy
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FHAB - Surface and thin film characterization
Theses
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Betrachtung der Kristallinitätsentwicklung in mikrokristallinem Dünnschicht-Silizium mit in-situ Raman-Spektroskopie /
Fink, Thomas
2018
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Betrachtung der Kristallinitätsentwicklung in mikrokristallinem Dünnschicht-Silizium mit in-situ Raman-Spektroskopie [E-Book] /
Fink, Thomas
2018
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1
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1
Material Type
Book
2
Type of Literature
Theses
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ZB
2
Name
Fink, Thomas
2
Subject
crystal structure analysis
2
microtechnology
2
raman spectroscopy
2
silicon
2
thin film
2
Classification
CUSE - Raman spectroscopy
FCA - Crystallography
2
FCBH - Crystal structure of specific substances
2
FCD - Crystal physics
2
FHAB - Surface and thin film characterization
Language
German
2
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