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FHAB - Surface and thin film characterization
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FCA - Crystallography
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FHAB - Surface and thin film characterization
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FCA - Crystallography
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Betrachtung der Kristallinitätsentwicklung in mikrokristallinem Dünnschicht-Silizium mit in-situ Raman-Spektroskopie /
Fink, Thomas
2018
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Fink, Thomas
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crystal structure analysis
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microtechnology
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raman spectroscopy
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silicon
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thin film
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CUSE - Raman spectroscopy
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FCA - Crystallography
FCBH - Crystal structure of specific substances
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FCD - Crystal physics
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FHAB - Surface and thin film characterization
Language
German
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